Probe contact and channel open-short test tools

Applicable purchasers

Semiconductor equipment, fixtures, laboratories and packaging supporting companies

Test and assembly objects

Probe cards or contact fixtures and reference boards

Development and delivery

Control switching matrix and low voltage measurements, record contact stability and channel mapping

Project input

Reference electrical measuring instruments, wiring contacts, excitation range and temperature conditions

Acceptance method

Check the channel mapping, open and short circuit and contact resistance according to the reference board, test the pin drop/contact repeatability and non-contact status, and do not use software connectivity to replace contact verification.

Implementation steps

Object and interface verification → Reference link and solution confirmation → Single module prototype → Instrument and equipment joint debugging → Independent reference re-inspection → Source code, configuration and record delivery.

Equipment condition and scope confirmation

The scope may include control boards, firmware, instrument drivers, host software, process configuration and test records. Mechanical fixtures, pressure-bearing structures, fluid circuits, power circuits and optical or acoustic references are provided or separately designed by the responsible parties. Measurement specifications are established through validation with the target equipment and independent references.

Source code, design documents, instrument licensing, procurement, on-site support and ongoing maintenance scope are listed in the project documents.

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